Fixes/Enhancements
- Support custom test definitions specified by a configuration file. A custom test definition consists of an existing test algorithm, specific test pattern, cache settings, and number of iterations. Custom test definitions are enabled by specifying the TESTCFGFILE parameter (Pro Edition only)
- Fixed incorrectly formatted XML Status/TestResult files sent to PXE/TFTP server (Site Edition only)
- Fixed incorrect reporting of error endianess for 128-bit test
- Fixed bug in displaying/logging ECC error channel/slot number
- Fixed report/log files not being saved correctly for non-standard USB flash drive installs
- Improved responsiveness of pattern string updated on screen
- Display row hammer warning, if applicable, in test completion popup message
- Fixed ECC error reporting on AMD Ryzen chipsets to include channel/slot information
- Fixed ECC error reporting on AMD Ryzen chipsets with 8 memory channels
- Improved robustness of ECC error reporting for Intel Atom C2000 chipsets
- Fixed retrieval of DDR4 SPD bytes on Intel Alder Lake chipsets
- Added support for parsing DDR3 Module Manufacturer's Specific Data
- Updated blacklist with additional Surface Pro models with display issues
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